The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2018
Filed:
May. 03, 2013
Applicant:
CR Development Ab, Lund, SE;
Inventors:
Assignee:
CR Development AB, Lund, SE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/56 (2006.01); G01R 33/563 (2006.01); G01N 24/08 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56341 (2013.01); G01N 24/08 (2013.01); G01R 33/56 (2013.01); G01R 33/56308 (2013.01); G01N 24/081 (2013.01);
Abstract
The present invention describes a method for quantifying microscopic diffusion anisotropy and/or mean diffusivity in a material by analysis of echo attenuation curves acquired with two different gradient modulations schemes, wherein one gradient modulation scheme is based on isotropic diffusion weighting and the other gradient modulation scheme is based on non-isotropic diffusion weighting, and wherein the method comprises analyzing by comparing the signal decays of the two acquired echo attenuation curves.