The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2018
Filed:
Jun. 16, 2010
Applicants:
Jason C. Reed, Santa Monica, CA (US);
Bhubaneswar Mishra, Great Neck, NY (US);
Andrew Sundstrom, Brooklyn, NY (US);
Inventors:
Jason C. Reed, Santa Monica, CA (US);
Bhubaneswar Mishra, Great Neck, NY (US);
Andrew Sundstrom, Brooklyn, NY (US);
Assignee:
The Regents of the University of California, Oakland, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01Q 30/04 (2010.01); B82Y 35/00 (2011.01); C12Q 1/68 (2018.01); G06T 7/60 (2017.01); G06F 19/16 (2011.01); G06F 19/24 (2011.01);
U.S. Cl.
CPC ...
G01Q 30/04 (2013.01); B82Y 35/00 (2013.01); C12Q 1/68 (2013.01); G06T 7/60 (2013.01); G06F 19/16 (2013.01); G06F 19/24 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/20036 (2013.01); G06T 2207/20072 (2013.01); G06T 2207/30004 (2013.01);
Abstract
The present disclosure provides methods of measuring a property of a macromolecule. The methods generally involve applying an empirically learned correction term to a test metric to generate a high-accuracy measurement. The present disclosure further provides a computer program product and a computer system for carrying out a subject method.