The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2018

Filed:

Nov. 11, 2015
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventor:

Yoshiaki Nakamura, Yokohama, JP;

Assignee:

KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/487 (2006.01);
U.S. Cl.
CPC ...
G01N 33/48721 (2013.01); G01N 33/48728 (2013.01);
Abstract

According to one embodiment, a measurement device includes a first chamber, a second chamber, a partition provided between the first and second chambers, a through hole which is provided in the partition and with which the first chamber and the second chamber communicate each other, a first electrode provided in the first chamber, and a second electrode provided in the second chamber. The first electrode and the second electrode contain different metals or alloys at least in surface layers thereof, and a relationship of Ia<Ib is satisfied, where Ia is an ionization tendency of a metal or an alloy contained at least in the surface layer of the first electrode and Ib is an ionization tendency of a metal or an alloy contained at least in the surface layer of the second electrode.


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