The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2018

Filed:

Feb. 10, 2016
Applicant:

Vega Grieshaber Kg, Wolfach, Wolfach, DE;

Inventor:

Thomas Kopp, Wolfach, DE;

Assignee:

VEGA GRIESHABER KG, Wolfach, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 19/14 (2006.01); F16J 15/00 (2006.01); F16J 15/06 (2006.01);
U.S. Cl.
CPC ...
G01L 19/142 (2013.01); F16J 15/002 (2013.01); F16J 15/062 (2013.01);
Abstract

A measuring arrangement with a measuring cell for detecting a process parameter and a housing, surrounding the measuring cell at least radially, with the measuring cell being arranged in the axial direction at the front in the housing and a space between the measuring cell and the housing being sealed with a seal from the penetration of process medium, with the seal showing at least a first sealing element radially surrounding a measuring cell and a second sealing element radially surrounding the measuring cell, the second sealing element being distanced from the first sealing element in the axial direction and arranged in front thereof, and the housing showing at least one first section extending in the axial direction and at least one second section arranged thereat and extending in the radial direction between the sealing elements.


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