The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2018
Filed:
Feb. 24, 2012
Michael Mcvay, Gainesville, FL (US);
Khiem Tat Tran, Gainesville, FL (US);
Rodrigo Herrera, Tallahassee, FL (US);
Peter Lai, Tallahassee, FL (US);
Michael McVay, Gainesville, FL (US);
Khiem Tat Tran, Gainesville, FL (US);
Rodrigo Herrera, Tallahassee, FL (US);
Peter Lai, Tallahassee, FL (US);
University of Florida Research Foundation, Inc., Gainesville, FL (US);
Florida Department of Transportation, Tallahassee, FL (US);
Abstract
Systems and methods are provided for dynamically determining a static tip resistance of a dynamically-loaded component having a tip. One example method comprises receiving gauge data from one or more gauges associated with the component proximate the tip. The gauge data may represent measurements related to one or more impacts on the component. The example method may further comprise determining measured data and estimated data corresponding to the one or more impacts on the component based at least in part on the gauge data. Furthermore, the method may comprise performing an inversion to select the estimated data having the least amount of difference in comparison to the measured data. The method may also comprise determining the static tip resistance based at least in part on the selected estimated data.