The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2018
Filed:
Nov. 29, 2016
Saturn Licensing Llc, New York, NY (US);
Kunihiko Nagamine, Kanagawa, JP;
Satoshi Tomioka, Kanagawa, JP;
Saturn Licensing LLC, New York, NY (US);
Abstract
An unevenness inspection apparatus includes circuitry that is configured to obtain a pickup image of a test object and modify a chroma value of a pixel in the pickup image to correct a gain of the pickup image associated with the pixel for generating a color unevenness inspection image. The circuitry is configured to generate a luminance unevenness inspection image based on the pickup image and calculate an evaluation parameter using both of the color unevenness inspection image and the luminance unevenness inspection image. The circuitry is configured to perform unevenness inspection using the calculated evaluation parameter, which is calculated based on unevenness visibility for both color and luminance.