The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2018
Filed:
Jan. 23, 2015
Applicant:
Cognex Corporation, Natick, MA (US);
Inventors:
Simon Barker, Sudbury, MA (US);
David J. Michael, Wayland, MA (US);
William M. Silver, Nobleboro, ME (US);
Assignee:
Cognex Corporation, Natick, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/00 (2006.01); G06T 7/00 (2017.01); G06K 9/32 (2006.01); G06K 9/62 (2006.01); G06K 9/68 (2006.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G01B 21/00 (2013.01); G06K 9/3241 (2013.01); G06K 9/6211 (2013.01); G06K 9/685 (2013.01); G06T 7/73 (2017.01); G06T 2207/10004 (2013.01);
Abstract
The present application discloses a probe placement module for placing probes on a virtual object depicted in an image. The probe placement module is configured to place probes on interest points of an image so that the probes can accurately represent a pattern depicted in the image. The probe placement module can be configured to place the probes so that the probes can extract balanced information on all degrees of freedom associated with the pattern's movement, which improves the accuracy of the model generated from the probes.