The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2018

Filed:

May. 19, 2017
Applicants:

Furukawa Electric Co., Ltd., Tokyo, JP;

Furukawa Automotive Systems Inc., Inukami-gun, Shiga, JP;

Inventors:

Sho Yoshida, Tokyo, JP;

Shigeki Sekiya, Tokyo, JP;

Kengo Mitose, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01R 9/05 (2006.01); H02G 15/04 (2006.01); H02G 15/013 (2006.01); C22F 1/04 (2006.01); C22C 21/02 (2006.01); C22F 1/043 (2006.01); H01B 1/02 (2006.01); H01B 13/00 (2006.01); C22F 1/00 (2006.01); H01B 5/02 (2006.01); H01B 5/08 (2006.01); H01B 7/00 (2006.01); H01B 7/02 (2006.01); H01R 11/11 (2006.01);
U.S. Cl.
CPC ...
C22F 1/04 (2013.01); C22C 21/02 (2013.01); C22F 1/00 (2013.01); C22F 1/043 (2013.01); H01B 1/023 (2013.01); H01B 5/02 (2013.01); H01B 5/08 (2013.01); H01B 7/0045 (2013.01); H01B 7/02 (2013.01); H01B 13/0016 (2013.01); H01B 13/0036 (2013.01); H01R 11/11 (2013.01);
Abstract

An aluminum alloy wire rod includes Mg: 0.1-1.0 mass %, Si: 0.1-1.2 mass %, Fe: 0.10-1.40 mass %, Ti: 0-0.100 mass %, B: 0-0.030 mass %, Cu: 0-1.00 mass %, Ag: 0-0.50 mass %, Au: 0-0.50 mass %, Mn: 0-1.00 mass %, Cr: 0-1.00 mass %, Zr: 0-0.50 mass %, Hf: 0-0.50 mass %, V: 0-0.50 mass %, Sc: 0-0.50 mass %, Co: 0-0.50 mass %, Ni: 0-0.50 mass %, and the balance: Al and inevitable impurities. In a cross section parallel to a wire rod lengthwise direction and including a center line of the wire rod, no void having an area greater than 20 μmis present, or even in a case where at least one void having an area greater than 20 μmis present, a presence ratio of the at least one void per 1000 μmis on average in a range of less than or equal to one void/1000 μm.


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