The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2018
Filed:
Mar. 18, 2016
Applicant:
Scott Hsieh, Anaheim, CA (US);
Inventor:
Scott Hsieh, Anaheim, CA (US);
Assignee:
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G21K 1/02 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5282 (2013.01); A61B 6/4291 (2013.01); G06T 11/008 (2013.01); G21K 1/025 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/30168 (2013.01);
Abstract
A device for estimating scatter in X-ray imaging is described. An anti-scatter grid with varying grid ratio is used in conjunction with an X-ray detector. The anti-scatter grid comprises attenuating lamellae that block scattered radiation. The anti-scatter grid contains regions of lesser or greater scatter rejection efficiency, which can be achieved by variations in the grid ratio. Contrast between these regions can be used to estimate residual scatter content. A method for estimating scatter from this device is further described.