The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2018

Filed:

Dec. 17, 2014
Applicant:

The Yoshida Dental Mfg. Co., Ltd., Tokyo, JP;

Inventor:

Terumi Takemoto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); A61B 6/14 (2006.01); A61B 6/02 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/027 (2013.01); A61B 6/14 (2013.01); A61B 6/4452 (2013.01); A61B 6/5205 (2013.01); A61B 6/4441 (2013.01);
Abstract

A cross section obtained by cutting an X-ray beam at a time of taking projection data from the X-ray beam detected by an X-ray sensor, with a plane, which is perpendicular to the central axis of the X-ray beam and runs through the central axis of a photographic region, is defined as a photography specification surface. The number of the photography specification surface per unit area in a plane, as the photographic region is viewed from a point in the direction along the central axis of the photographic region, is defined as overlap density of the projection data. A controller of an X-ray photography device executes a leveling control which levels the overlap density of the projection data between at an outer portion and inner portion of the photographic region. Thus, an X-ray photographic device is provided that is capable of improving the image quality in the entire photographic region.


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