The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2018
Filed:
Apr. 05, 2012
Akihiro Ishikawa, Kyoto, JP;
Yoshihiro Inoue, Kyoto, JP;
Takashi Amita, Kyoto, JP;
Satoru Kohno, Fuchu, JP;
Haruhide Udagawa, Kyoto, JP;
Yoshinori Masuda, Kyoto, JP;
Akihiro Ishikawa, Kyoto, JP;
Yoshihiro Inoue, Kyoto, JP;
Takashi Amita, Kyoto, JP;
Satoru Kohno, Fuchu, JP;
Haruhide Udagawa, Kyoto, JP;
Yoshinori Masuda, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
An optical measuring system comprises a control device and an optical meter. The optical meter comprises a first case, a first controller for controlling light emitters for irradiating a patient with light and light receivers for receiving light from the patient to obtain measurement data regarding a cerebral activity, and a first transmitter and receiver for transmitting the measurement data to the control device. The control device comprises a second case removably attached to the first case, a display and input device on a surface of the second case, a second transmitter and receiver for receiving the measurement data from the optical meter, and a second controller for controlling the display and input device to display the measurement data from the optical meter. The second case can be attached on a top face of the first case when the first case is placed on a table.