The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2018
Filed:
Sep. 11, 2013
Siemens Aktiengesellschaft, Munich, DE;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
An example embodiment relates to a method for automatically stipulating a spectral distribution of the X-ray radiation of a number of X-ray sources of a computed tomography system. This involves firstly stipulating start control parameters of an X-ray source, which determine the dose and spectral distribution of X-ray radiation. On the basis of an expected attenuation of the X-ray radiation by an examination object, an examination-object-specific basic control parameter is then ascertained proceeding from the start control parameters. Afterwards, on the basis of the expected attenuation of the X-ray radiation by the examination object and the basic control parameter, first target control parameters and second target control parameters are ascertained for setting the spectral distribution of the X-ray radiation in a subsequent multi-energy measurement on the examination object. Moreover, a method, a control device suitable, and a computed tomography system comprising such a control device are described.