The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2018

Filed:

Jun. 16, 2017
Applicant:

Heptagon Micro Optics Pte. Ltd., Singapore, SG;

Inventor:

Florin Cutu, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/00 (2018.01); H04N 13/02 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0007 (2013.01); H04N 13/0207 (2013.01); H04N 13/0246 (2013.01); H04N 13/0253 (2013.01);
Abstract

The disclosure describes optoelectronic devices for collecting three-dimensional data without determining disparity. The approach permits significant flexibility relative to state-of-the-art approaches for collecting three-dimensional data. For example, the illuminations (e.g., patterns) generated by the disclosed devices need not exhibit the same degree of complexity or randomness of illuminations generally required by structured-light approaches. Further, the devices described in the present disclosure exhibit, in some instances, optimal resolution over a wide distance range. An optoelectronic device described herein is operable to generate an illumination comprising a plurality of high-intensity features that exhibit a distance-dependent alteration when imaged by an imager incorporated into the optoelectronic device.


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