The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2018
Filed:
May. 20, 2016
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Anton Strohmeier, Munich, DE;
Michael Block, Munich, DE;
Ralf Plaumann, Forstern, DE;
Thomas Lutz, Munich, DE;
Franz Obermayr, Kirchdorf an der Amper, DE;
Christiane Klaus, Munich, DE;
Jens Volkmann, Birnbach, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
The invention is related to a smart testing apparatus and preferably a method for testing at least a first DUT and a second DUT using a mobile communications testing device. The method comprises the steps of determining, whether a first RF test signal from/to the first DUT interferes with a second RF test signal from/to the second DUT. It determines, whether the second RF test signal from/to second DUT interferes with the first RF test signal from/to the first DUT. It predetermines, whether at least measuring the first measuring result obtained by applying the first RF test signal is disturbed above a first disturbance threshold value. It predetermines, whether at least a second measuring result obtained by applying the second RF test signal is disturbed above a second disturbance threshold value.