The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2018

Filed:

Jun. 23, 2015
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Sandeep R. Bahl, Palo Alto, CA (US);

Michael D. Seeman, San Jose, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 23/00 (2006.01); H01L 27/085 (2006.01); H01L 29/78 (2006.01); H01L 29/40 (2006.01); H01L 29/778 (2006.01); H01L 21/8258 (2006.01); H01L 27/088 (2006.01); H01L 29/20 (2006.01);
U.S. Cl.
CPC ...
H01L 24/97 (2013.01); H01L 21/8258 (2013.01); H01L 24/48 (2013.01); H01L 27/085 (2013.01); H01L 27/088 (2013.01); H01L 29/404 (2013.01); H01L 29/7786 (2013.01); H01L 29/78 (2013.01); H01L 29/2003 (2013.01); H01L 2224/48137 (2013.01); H01L 2924/00014 (2013.01);
Abstract

A high-voltage transistor (HVT) structure adapts a low-voltage transistor (LVT) to high-voltage environments. The HVT structure includes a drain node, a source node, a control gate, and a field electrode. The drain node and the source node define a conductive channel, in which mobilized charges are regulated by the control gate. While being isolated from the control gate, the field electrode is configured to spread the mobilized charges in response to a field voltage. The field electrode is structured and routed to prevent charge sharing with any one of the drain node, source node, or control gate. Advantageously, the isolated field electrode minimizes the capacitance of the control gate as well as the drain and source nodes, such that the HVT can switch with less power loss and a more robust performance in a high-voltage environment.


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