The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2018

Filed:

Jun. 21, 2016
Applicant:

Thermo Finnigan Llc, San Jose, CA (US);

Inventors:

Christopher Mullen, Menlo Park, CA (US);

Chad R. Weisbrod, San Jose, CA (US);

John E. P. Syka, Charlottesville, VA (US);

Assignee:

Thermo Finnigan LLC, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/62 (2006.01); H01J 49/00 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0072 (2013.01); G01N 27/62 (2013.01); H01J 49/0027 (2013.01); H01J 49/4225 (2013.01);
Abstract

A method is described that produces product ions for mass analysis, the method comprising the steps of: introducing precursor ions into an RF electric field ion containment device, introducing reagent ions into the RF electric field ion containment device and performing an ion-ion interaction in the RF electric field ion containment device by co-trapping the precursor ions with the reagent ions. Precursor ions and product ions may be retained and/or isolated in the RF electric field ion containment device. The steps above may be repeated until a predetermined amount of reaction completeness is attained. Mass analysis of at least some of the ions in the RF electric field ion containment device may be performed where the ions are mass analyzed either directly from the RF electric field ion containment device.


Find Patent Forward Citations

Loading…