The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2018
Filed:
May. 01, 2017
Sas Institute Inc., Cary, NC (US);
Sergiy Peredriy, Auburndale, MA (US);
Deovrat Vijay Kakde, Cary, NC (US);
Arin Chaudhuri, Raleigh, NC (US);
SAS Institute Inc., Cary, NC (US);
Abstract
A computing device determines a kernel parameter value for a support vector data description for outlier identification. A first candidate optimal kernel parameter value is computed by computing a first optimal value of a first objective function that includes a kernel function for each of a plurality of kernel parameter values from a starting kernel parameter value to an ending kernel parameter value using an incremental kernel parameter value. The first objective function is defined for a SVDD model using observation vectors to define support vectors. A number of the observation vectors is a predefined sample size. The predefined sample size is incremented by adding a sample size increment. A next candidate optimal kernel parameter value is computed with an incremented number of vectors until a computed difference value is less than or equal to a predefined convergence value.