The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2018
Filed:
Mar. 27, 2017
Applicant:
Sony Corporation, Tokyo, JP;
Inventors:
Yusuke Nakamura, Chiba, JP;
Shinichiro Gomi, Tokyo, JP;
Assignee:
Sony Corporation, , JP;
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/52 (2006.01); G06T 7/00 (2017.01); A61B 5/00 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06K 9/52 (2013.01); A61B 5/441 (2013.01); G06K 9/0014 (2013.01); G06T 7/0014 (2013.01); G06K 9/46 (2013.01);
Abstract
An epidermis pattern detection unit detects epidermis patterns in an epidermis image captured from the epidermis of skin by an epidermis image capturing unit. An acquired element analysis unit analyzes uniformity of shapes of the epidermis patterns in the epidermis image. A texture evaluation unit evaluates a texture state of the skin based on the uniformity of shapes of the epidermis patterns. The present technology, for example, may be applied to systems that evaluate the texture state of the skin.