The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2018

Filed:

Oct. 23, 2014
Applicants:

Qiang Han, Vancouver, CA;

Alexei Potiagalov, Richmond, CA;

Inventors:

Qiang Han, Vancouver, CA;

Alexei Potiagalov, Richmond, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30241 (2013.01); G06F 17/30259 (2013.01); G06F 17/30528 (2013.01); G06F 17/30592 (2013.01);
Abstract

Methods and apparatus, including computer program products, are provided for spatial analytics. The method may include generating a query including spatial context information, the query structured to include a predicate for the query and the spatial context information, the spatial context information including at least one of feature information or geometric information; and sending the query to a spatial query processor including a database in order to generate a query response in accordance with the predicate and spatial context information. Related systems, methods, and articles of manufacture are also disclosed.


Find Patent Forward Citations

Han, Qiang. (2018). Spatial analytics extensions (U.S. Patent No. 9990374). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9990374

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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