The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2018

Filed:

Sep. 23, 2016
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Bradley Joel Jensen, San Francisco, CA (US);

Carter Peterson, San Francisco, CA (US);

Stephen J. Rhee, San Jose, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 3/06 (2006.01); G06F 12/02 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0607 (2013.01); G06F 3/0631 (2013.01); G06F 3/0685 (2013.01); G06F 12/023 (2013.01); G06F 2212/1044 (2013.01);
Abstract

Described are a system and technique for collecting stack trace information of devices and analyzing this information to provide metrics with respect to memory usage. The memory analysis includes attributing the memory usage to particular development components by traversing a stack trace. For example, the development components may correspond to a classification used for a particular development effort such as a group of classes, a sub-project, or a development team. As a result, the system may produce various metrics that produce memory usage information attributable to a more meaningful conceptual unit rather than, for example, function names. Accordingly, these attributions may be analyzed for forensic purposes to get a more meaningful picture of sources and causes of memory usage.


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