The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2018

Filed:

Jan. 22, 2016
Applicant:

Materion Corporation, Mayfield Heights, OH (US);

Inventor:

Robert Sprague, Westford, MA (US);

Assignee:

MATERION CORPORATION, Mayfield Heights, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 5/28 (2006.01); C23C 14/16 (2006.01); C23C 14/34 (2006.01); G02B 5/20 (2006.01); C23C 14/06 (2006.01); C23C 14/10 (2006.01);
U.S. Cl.
CPC ...
G02B 5/281 (2013.01); C23C 14/0652 (2013.01); C23C 14/10 (2013.01); C23C 14/165 (2013.01); C23C 14/34 (2013.01); C23C 14/3414 (2013.01); G02B 5/207 (2013.01); G02B 5/208 (2013.01);
Abstract

An interference filter includes a layers stack comprising a plurality of layers of at least: layers of amorphous hydrogenated silicon with added nitrogen (a-Si:H,N) and layers of one or more dielectric materials, such as SiO, SiO, SiON, a dielectric material with a higher refractive index in the range 1.9 to 2.7 inclusive, or so forth. The interference filter is designed to have a passband center wavelength in the range 750-1000 nm inclusive. Layers of a dielectric material with a higher refractive index in the range 1.9 to 2.7 inclusive provide a smaller angle shift compared with a similar interference filter using SiOas the low index layers.


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