The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2018
Filed:
Dec. 19, 2014
Applicant:
Nuctech Company Limited, Haidian District, Beijing, CN;
Inventors:
Assignee:
Nuctech Company Limited, Haidian District, Beijing, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2018.01); G01V 5/00 (2006.01);
U.S. Cl.
CPC ...
G01V 5/0016 (2013.01);
Abstract
The present invention provides an inspection system for a container. It comprises: a radiation source, configured to provide X-rays for scanning the container; a detector, configured to receive the X-rays emitted from the radiation source; a body of the inspection system, on which the radiation source and the detector are provided; wherein a size of the body of the inspection system is set to facilitate the inspection of the container. The inspection system of the present invention can inspect in batches the container in the wharf or goods yard.