The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2018
Filed:
Apr. 03, 2015
Applicant:
Siemens Aktiengesellschaft, Munich, DE;
Inventors:
Theresa Bachschmidt, Erlangen, DE;
Mathias Nittka, Baiersdorf, DE;
Assignee:
Siemens Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/565 (2006.01); G01R 33/34 (2006.01); G01R 33/385 (2006.01); G01R 33/48 (2006.01); G01R 33/483 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56536 (2013.01); G01R 33/34 (2013.01); G01R 33/385 (2013.01); G01R 33/4828 (2013.01); G01R 33/4835 (2013.01); G01R 33/5608 (2013.01);
Abstract
In a method and apparatus for acquiring a magnetic resonance (MR) data set from a target area of a patient containing at least one metal object that distorts the basic magnetic field due to susceptibility differences, a slice selection gradient that rises in one direction is used to select a slice from which MR data are to be acquired. At least for at least one outermost edge slice on one side of the slice stack from which the MR data are to be acquired, the polarity of the slice selection gradient is selected as a function of a primary direction of distortion in the edge slice.