The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2018

Filed:

Mar. 29, 2013
Applicant:

Sysmex Corporation, Kobe-shi, Hyogo, JP;

Inventors:

Masakazu Fukuda, Kobe, JP;

Masamichi Tanaka, Kobe, JP;

Rumi Takata, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/10 (2006.01); G01N 21/64 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6486 (2013.01); G01N 35/1004 (2013.01); G01N 35/1095 (2013.01);
Abstract

Disclosed is a sample analyzer comprising: a sample measuring section including a detecting section for detecting a component contained in a sample and a flow path for feeding the sample to the detecting section; and a control section. The control section is programmed to automatically control the sample measuring section to flow a sample blank free of particles to the detecting section and detect a component contained in the sample blank to check a background of the detection after the sample measuring section performs washing of the flow path.


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