The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2018
Filed:
Mar. 02, 2015
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Sandra Skaff, Mountain View, CA (US);
Chao Liu, Irvine, CA (US);
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01); G01N 21/25 (2006.01); B07C 5/342 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 21/55 (2013.01); B07C 5/342 (2013.01); G01N 21/255 (2013.01); G01N 2021/845 (2013.01); G01N 2201/0627 (2013.01); G01N 2201/12 (2013.01);
Abstract
Material classification of an object is provided. Parameters for classification are accessed. The parameters include a selection to select a subset of angles for classification, a selection to select a subset of spectral bands for classification, a selection to capture texture features, and a selection to compute image-level features. The object is illuminated and a feature vector is computed based on the parameters. The material from which the object is fabricated is classified using the feature vector.