The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2018
Filed:
Jan. 23, 2017
Iei Integration Corp., New Taipei, TW;
Armorlink Sh Corp., Shanghai, CN;
IEI Intergration Corp., New Taipei, TW;
Armorlink SH Corp., Shanghai, CN;
Abstract
A method for creating a uniformity compensation look-up table is revealed. The method includes the following steps. First measure a plurality of areas on a plane users intend to make uniform to get a measured value of the respective area. Then get a central uniform estimate of a center of the plane. Also get a linear skeleton according to the position of one of the measured values and the position of the central uniform estimate. Next get a plurality of skeletal uniform estimates on the linear skeletons respectively by interpolation or extrapolation of the measured values, the central uniform estimate, and the distance between the position of the measured values and the center of the plane. At last get a plurality of planar uniform estimates on the plane in turn according to the skeletal uniform estimates of the two adjacent linear skeletons to establish the look-up table.