The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2018
Filed:
Sep. 15, 2016
Applicant:
Olympus Corporation, Hachioji-shi, Tokyo, JP;
Inventor:
Seiki Toriyama, Hino, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01); A61B 1/00 (2006.01); A61B 1/07 (2006.01); A61B 5/00 (2006.01); A61B 5/053 (2006.01); G01N 21/49 (2006.01); A61B 5/01 (2006.01);
U.S. Cl.
CPC ...
A61B 1/00039 (2013.01); A61B 1/00096 (2013.01); A61B 1/07 (2013.01); A61B 5/0084 (2013.01); A61B 5/0538 (2013.01); A61B 5/6886 (2013.01); A61B 5/01 (2013.01); A61B 5/4238 (2013.01); A61B 5/4255 (2013.01); G01N 21/49 (2013.01); G01N 2201/08 (2013.01);
Abstract
A measurement probe includes: a plurality of optical fibers including an illumination fiber configured to propagate light to irradiate a measuring object and including a light receiving fiber configured to receive scattered light retuned from the measuring object; and a detection portion configured to detect contact with the measuring object, the detection portion having a contact part provided on a part of a side portion of the measurement probe, the side portion forming a surface along a longitudinal direction of the measurement probe, the contact part being configured to be in contact with measuring object.