The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Feb. 04, 2016
Applicant:

Karl Storz, Imaging, Inc., Goleta, CA (US);

Inventors:

Efrain O. Morales, Santa Barbara, CA (US);

Jonathan Bormet, Goleta, CA (US);

Assignee:

KARL STORZ, Imaging, Inc., Goleta, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/00 (2011.01); H04N 5/235 (2006.01); H04N 5/232 (2006.01); H04N 5/225 (2006.01); H04N 5/357 (2011.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
H04N 5/235 (2013.01); G06K 9/46 (2013.01); H04N 5/2256 (2013.01); H04N 5/23238 (2013.01); H04N 5/357 (2013.01); G06K 2009/4666 (2013.01);
Abstract

Improved exposure control processes, devices, and systems are provided for wide angle lens imaging systems that suffer from image distortion. The exposure control uses a model of the wide angle lens distortion that estimates the weights that respective pixels of the image would have when producing an undistorted version of the image signal, and then scales pixel intensity values by the respective weights to produce weighted pixel values. The weighted pixel values are provided to an exposure control pixel counting process to produce one or more exposure feedback control signals, which control exposure features of the imaging system.


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