The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2018
Filed:
Jan. 29, 2016
Applicants:
Daniel G Van Olst, Menlo Park, CA (US);
Kathrin Berkner, Los Altos, CA (US);
Ramya Narasimha, Palo Alto, CA (US);
Inventors:
Daniel G Van Olst, Menlo Park, CA (US);
Kathrin Berkner, Los Altos, CA (US);
Ramya Narasimha, Palo Alto, CA (US);
Assignee:
Ricoh Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G06T 3/00 (2006.01); G06T 3/40 (2006.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
H04N 5/23219 (2013.01); G06T 3/0006 (2013.01); G06T 3/4038 (2013.01); G06T 7/73 (2017.01); H04N 5/23222 (2013.01); H04N 5/23238 (2013.01); H04N 5/23293 (2013.01); G06T 2200/24 (2013.01); G06T 2207/30244 (2013.01);
Abstract
A system and method that calculates a yaw error in an image and provides a user interface to a user for correcting the yaw error. The method includes receiving an image, performing line detection in the image, computing a line parameterization for lines in the image, computing a yaw angle for the image and providing the yaw data calculated in the image.