The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2018
Filed:
Nov. 22, 2016
Keysight Technologies, Inc., Minneapolis, MN (US);
Gregory S. Lee, Mountain View, CA (US);
Christopher Coleman, Santa Clara, CA (US);
Keysight Technologies, Inc., Santa Rosa, CA (US);
Abstract
A test system for testing a DUT includes a first array of probe elements located in the near field of the DUT antenna that is either mechanically translated or electrically scanned in a first direction while being electrically scanned in a second direction that is different from the first direction to sense a bounded radiation surface comprising RF signals transmitted by the DUT antenna. A test system receiver receives first near field values contained in the RF signals and inputs them to processing logic of the test system. A reference measurement apparatus of the test system detects the RF signals and obtains reference information therefrom. Processing logic of the test system uses the reference information to correct near field phase values contained in or derived from the first near field values for phase shift between the local oscillator (LO) of the DUT and the LO of the test system.