The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Aug. 15, 2016
Applicant:

GM Global Technology Operations Llc, Detroit, MI (US);

Inventor:

Ming Zhao, Northville, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06M 3/02 (2006.01); H01H 47/00 (2006.01); H03K 21/38 (2006.01); B60T 7/08 (2006.01); B60R 16/023 (2006.01);
U.S. Cl.
CPC ...
H01H 47/002 (2013.01); B60R 16/0231 (2013.01); B60T 7/085 (2013.01); H03K 21/38 (2013.01);
Abstract

A method for detecting a latent failure mode in an electronic selector having an interface switch and at least two underlying switches includes tracking and counting each of the underlying switch's close/open status change counts in the context of tracking and counting the interface switch selection status change counts. The method continues by calculating the ratio of each underlying switch's close or open status change counts against the interface switch selection status change counts. By comparing these ratios from each underlying switch in respect to the interface switch selection status change counts, a set of new algorithms are formulated to detect an interface switch latent failure mode due to either one of the at least two underlying switches stuck to open or one of the at least two underlying switches chattering between close and open states at a relatively high frequency compared to the interface switch selection event.


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