The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Oct. 03, 2016
Applicant:

Okuma Corporation, Niwa-Gun, JP;

Inventors:

Tomoharu Ando, Niwa-Gun, JP;

Takaaki Tanaka, Niwa-Gun, JP;

Assignee:

Okuma Corporation, Niwa-Gun, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06K 9/62 (2006.01); G06T 7/60 (2017.01); G01L 1/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01L 1/00 (2013.01); G06K 9/00536 (2013.01); G06K 9/6267 (2013.01); G06T 7/60 (2013.01); G06T 2207/30164 (2013.01);
Abstract

In an NC device having a function as a monitoring apparatus for a machine tool, a monitoring parameter and a retracting parameter which are set and inputted through an input unit by an operator, can be stored in a storage unit. When, for example, monitoring is performed by using a load on a main spindle as machine information, a machining monitoring unit displays a monitored state on a monitor, and compares a threshold value, of the load on the main spindle, according to which occurrence of abnormality is determined, and which is set in the monitoring parameter, and an instruction load generated by a machine operation instruction unit with each other, to determine whether or not abnormality has occurred. When abnormality is determined as having occurred, a retracting instruction is transmitted to a retracting instruction unit according to the retracting parameter, and display is performed on the monitor.


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