The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Mar. 31, 2016
Applicant:

Wipro Limited, Bangalore, IN;

Inventors:

Venkatakrishnan Rajaram, Bengaluru, IN;

Narayanan Ramani Konnayar, Bengaluru, IN;

Ria Chakraborty, Kolkata, IN;

Malathi Bellam Soundararajan, Bangalore, IN;

Assignee:

WIPRO LIMITED, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/27 (2006.01); G06F 17/21 (2006.01); G06Q 30/00 (2012.01);
U.S. Cl.
CPC ...
G06Q 30/016 (2013.01); G06F 17/271 (2013.01); G06F 17/2725 (2013.01); G06F 17/2775 (2013.01);
Abstract

The present disclosure relates to method and system for automatically identifying one or more issues in one or more tickets of an organization. An issue identification system retrieves a sequence pattern from ticket data received from one or more data sources. The issue identification system generates one or more first sub-sequence patterns of the n-grams from the sequence pattern. Further, frequency of occurrence and Part-of-Speech (POS) weightage of each of the one or more first sub-sequence patterns of the n-grams are determined by the issue identification system. A first score is determined for each of the one or more first sub-sequence patterns of the n-grams based on both the frequency and the POS weightage. Upon determining the first score, the issue identification system identifies one or more issues in the one or more tickets automatically based on the first sub-sequence pattern of the n-grams associated with a highest first score.


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