The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Dec. 02, 2014
Applicant:

Ca, Inc., New York, NY (US);

Inventors:

Suril Desai, Bangalore, IN;

Swaminathan Narayanan, Bangalore, IN;

Akash Rai, Mumbai, IN;

Assignee:

CA, INC., New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 20/32 (2012.01); G06Q 20/40 (2012.01); H04L 29/06 (2006.01); G06F 21/44 (2013.01);
U.S. Cl.
CPC ...
G06Q 20/3226 (2013.01); G06F 21/44 (2013.01); G06Q 20/3227 (2013.01); G06Q 20/4016 (2013.01); H04L 63/0876 (2013.01);
Abstract

A method of identifying a device includes receiving a device transaction request from a remote device, receiving a first device fingerprint of the remote device, and receiving a second device fingerprint of a known device. The first device fingerprint is compared with the second device fingerprint and a first metric indicative of a similarity of the first device fingerprint and the second device fingerprint is generated. A third device fingerprint corresponding to an expected current value of the second device fingerprint is generated, and the first device fingerprint is compared with the third device fingerprint to generate a second metric indicative of a similarity of the first device fingerprint and the third device fingerprint. A response to the transaction request is formulated based on the first metric and the second metric.


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