The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Jul. 07, 2016
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Deepak Kumar Poddar, Karnataka, IN;

Pramod Kumar Swami, Karnataka, IN;

Prashanth Viswanath, Karnataka, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4609 (2013.01); G06K 9/6202 (2013.01);
Abstract

This invention transforms a list of feature points in raster scan order into a list of maxima suppressed feature points. A working buffer has two more entries than the width of the original image. Each entry is assigned to an x coordinate of the original image. Each entry stores a combined y coordinate and reliability score for each feature point in the original list. This process involves a forward scan and a backward scan. For each original feature point its x coordinate defines the location within the working buffer where neighbor feature points would be stored if they exist. The working buffer initial data and the y coordinates assure a non suppress comparison result if the potential neighbors are not actual neighbors. For actual neighbor data, the y coordinates match and the comparison result depends solely upon the relative reliability scores.


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