The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

May. 01, 2015
Applicant:

Morpho Detection, Llc, Newark, CA (US);

Inventors:

Jixu Chen, Niskayuna, NY (US);

Peter Henry Tu, Niskayuna, NY (US);

Ming-Ching Chang, Clifton Park, NY (US);

Yelin Kim, Ann Arbor, MI (US);

Siwei Lyu, Albany, NY (US);

Assignee:

Morpho Detection, LLC, Newark, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30784 (2013.01);
Abstract

A method for analyzing time series data to identify an event of interest is provided. The method includes receiving, at a computing device, time series data that includes the event of interest, identifying, using the computing device, a start time of the event of interest and an end time of the event of interest by modeling at least one transitional pattern in the time series data, and categorizing, using the computing device, the event of interest based on the at least one transitional pattern.


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