The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Jul. 10, 2014
Applicants:

Leo HU, Shanghai, CN;

Yuan Fang, Shanghai, CN;

Yun Jin, Shanghai, CN;

Wen-syan LI, Fremont, CA (US);

Inventors:

Leo Hu, Shanghai, CN;

Yuan Fang, Shanghai, CN;

Yun Jin, Shanghai, CN;

Wen-Syan Li, Fremont, CA (US);

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30445 (2013.01); G06F 17/3048 (2013.01); G06F 17/30442 (2013.01);
Abstract

A query analyzer may be used to identify a plurality of queries and associated query characteristics, the query characteristics including a corresponding dataset of data units for each query, wherein the data units are to be loaded from an offline memory into a memory of an in-memory database. Then, a sequencer may be used to select a selected dataset for loading into the memory of the in-memory database, based on dependencies between the plurality of queries as included within the query characteristics, and on relationships, if any, between the datasets.


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