The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Sep. 21, 2015
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Anup Kumar Rai, Bengaluru, IN;

Suchit Mathur, Bengaluru, IN;

Ashwini Deshpande, Bengaluru, IN;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01); G06F 11/36 (2006.01); G06F 9/44 (2018.01); G06F 9/445 (2018.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 8/65 (2013.01); G06F 8/70 (2013.01); G06F 11/3692 (2013.01);
Abstract

A method, implemented at least in part by a computing device, for software upgrade analysis includes receiving a selection of at least one object class of a plurality of available object classes. One or more application programming interface (API) calls may be retrieved from a plurality of API calls based on the received selection. A test definition may be generated based at least in part on the one or more API calls. A first test may be executed by using the one or more API calls in the test definition within a software environment. The first test is run on the software environment prior to upgrading the environment. Subsequent to upgrading the environment, a second test is executed by using the one or more API calls within the upgraded software environment. A software upgrade report is generated based on a comparison of test results from the first and second tests.


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