The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2018
Filed:
Jun. 23, 2016
Amdocs Development Limited, Limassol, CY;
Pravin Mohanlal Mundada, Pune, IN;
Kanya Gupta, Pune, IN;
Arindam Chakraborty, Pune, IN;
Sanjay Bhatia, Pune, IN;
Vikram Pandey, Pune, IN;
Amdocs Development Limited, Limassol, CY;
Abstract
A system, method, and computer program product are provided for implementing optimal regression test strategies. In use, one or more functional testing entities are identified to be utilized to determine a scope associated with at least one regression test to be performed. The at least one regression test to be performed is associated with at least one change made to a functional system based on multi-dimensional modelling. Additionally, source code is mapped to the one or more functional testing entities, the source code being associated with the functional system. Further, a multi-dimensional impact score is calculated for each of the one or more functional testing entities resulting from the at least one change made to the functional system, based on the mapping of the source code to the one or more functional testing entities. Moreover, an output is generated showing impacted functional testing entities based on the multi-dimensional impact score for each of the one or more functional testing entities.