The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2018
Filed:
May. 15, 2015
Xilinx, Inc., San Jose, CA (US);
Yi-Hua E. Yang, San Jose, CA (US);
Patrick Lysaght, Los Gatos, CA (US);
XILINX, INC., San Jose, CA (US);
Abstract
Techniques for efficient benchmarking. One method includes obtaining convergent results by performing a benchmarking test with a particular length to obtain a result (time), scaling the time exponentially, performing additional benchmarking tests, obtaining results for those tests, and determining whether the results scale linearly with length. Another method includes obtaining variance for non-convergent results by performing multiple sequences of benchmarking test. Within each new sequence performed, the benchmarking tests are spaced out further apart in time. If new maximum or minimum results are obtained, then further test sequences are performed and if no new maximum or minimum results are obtained after a threshold number of sequences, then the test ends. A device and computer-readable medium for performing benchmarking are also provided herein.