The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2018
Filed:
May. 20, 2016
International Business Machines Corporation, Armonk, NY (US);
Thierry Supplisson, Cork, IE;
Eric Thiebaut-George, Cork, IE;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Data lifecycle management is performed by managing metrics from a monitored system. A fault is identified from the monitored system. One or more metrics that are directly related to the fault and one or more metrics that are indirectly related to the fault by virtue of being directly or indirectly related to the one or more directly related metrics are identified and stored in a memory. A lifespan condition associated with the fault is identified. A lifespan for each of the directly and indirectly related metrics based on the identified lifespan condition is added or changed. A metric that is critically related to another metric will inherit the same lifespan, and a metric that is related but not critically related to another metric will not inherit the other metric's lifespan. Metrics are removed from the memory if their associated lifespans are over.