The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2018
Filed:
Nov. 17, 2014
Olympus Corporation, Shibuya-ku, Tokyo, JP;
Shingo Tamano, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A scanning microscope includes a collecting lens that takes in a detection light, a focal position adjustment unit that moves in an optical axis direction of the collecting lens to make the collecting lens move in the optical axis direction, a detector positioned at a location that is optically conjugate to a pupil of the collecting lens, and a relay optical system that relays the pupil to the detector. The relay optical system includes a first optical element with a positive power, the first optical element being positioned in the focal position adjustment unit and converting the detection light that was converted by the collecting lens into a parallel light flux, into a convergent light flux to be emitted outside of the focal position adjustment unit, and a second optical element that is positioned outside of the focal position adjustment unit and between the detector and the first optical element.