The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2018
Filed:
Oct. 20, 2014
Realtek Semiconductor Corp., HsinChu, TW;
Pei-Ying Hsueh, Changhua County, TW;
Chun-Yi Kuo, New Taipei, TW;
Chien-Mo Li, Taipei, TW;
Chieh-Chih Che, Taoyuan County, TW;
Realtek Semiconductor Corp., HsinChu, TW;
Abstract
A multiple defect diagnosis method includes: receiving a gate-level netlist of a chip, a plurality of test patterns and a plurality of test failure reports; deriving a plurality of seed nets from the gate-level netlist according to the plurality of test patterns and the plurality of test failure reports; utilizing a processor to compute similarity between the plurality of seed nets, and accordingly merging the plurality of seed nets to obtain a single seed net tree; and deriving at least one suspected seed net according to the single seed net tree.