The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2018
Filed:
Jun. 30, 2016
Amazon Technologies, Inc., Seattle, WA (US);
Dan Trock, Katzrin, IL;
Ron Diamant, Albany, CA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
A device includes one or more random number generator (RNG) cores (e.g., true random number generator cores) and a built-in self-test controller (BIST) configured to perform various fault tests on each RNG core. The tests include a stuck-at-1 fault test, a stuck-at-0 fault test, and a transition delay fault test. For those RNG cores that have multiple ring oscillators, each individual ring oscillator is fault tested by the BIST controller. For those RNG cores that have a multi-tap inverter chain configuration, the individual taps may be tested by the BIST controller. The RNG core also may comprise a bi-stable cell which can be tested by the BIST controller as well.