The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Jun. 18, 2015
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jong-won Han, Cheonan-si, KR;

Jong-woo Lee, Seoul, KR;

Young-gi Min, Asan-si, KR;

Soon-won Lee, Suwon-si, KR;

Yong-in Lee, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 1/04 (2006.01); H01R 24/20 (2011.01); H01B 1/02 (2006.01); H01B 1/04 (2006.01); H01R 13/03 (2006.01); G01R 31/26 (2014.01); H01R 13/24 (2006.01); H01R 107/00 (2006.01);
U.S. Cl.
CPC ...
G01R 1/0433 (2013.01); G01R 31/26 (2013.01); H01B 1/02 (2013.01); H01B 1/04 (2013.01); H01R 13/03 (2013.01); H01R 13/2414 (2013.01); H01R 24/20 (2013.01); H01R 2107/00 (2013.01); H01R 2201/20 (2013.01);
Abstract

A test socket is provided that includes a base material including an insulating elastic material and a conductive portion extending through the base material in a thickness direction of the base material, wherein the conductive portion includes a plurality of conductive particle structures arranged in the thickness direction of the base material, and each of the plurality of conductive particle structures includes a plurality of conductive particles having at least one insulating wire and/or at least one conductive wire extending from a surface of the conductive particle, bonded with a material having a functional group.


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