The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Oct. 14, 2015
Applicant:

Airbus Operations (S.a.s.), Toulouse, FR;

Inventor:

Franck Bentouhami, Chavagnes en Paillers, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/24 (2006.01); G01N 29/04 (2006.01); G01N 29/30 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/04 (2013.01); G01N 29/24 (2013.01); G01N 29/30 (2013.01); G01N 29/44 (2013.01); G01N 29/4427 (2013.01); G01N 2291/2694 (2013.01);
Abstract

A method and assembly for verification of the calibration of a system for non-destructive testing of pieces. The assembly includes an ultrasound probe, a perfect reflector having reference defects, and recording and data processing units. The ultrasound probe scans the perfect reflector and ultrasonic reflections from the reflector are measured by the non-destructive testing system, a recording unit records the measurements, and a data processing unit forms a virtual map of the perfect reflector based on the amplitude and time of flight of the reflections and based on predetermined characteristics of the material of the reflector.


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