The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2018
Filed:
Sep. 30, 2015
Jenoptik Industrial Metrology Germany Gmbh, Villingen-Schwenningen, DE;
Michael Rudolf, Constance, DE;
JENOPTIK Industrial Metrology Germany GmbH, Villingen-Schwenningen, DE;
Abstract
A testing device for testing an inner surface of a rotationally symmetrical cavity in a workpiece has a measuring head which defines an axial direction, and on which an optical system is situated. The optical system is in image transmission connection with an image recorder and a downstream evaluation apparatus. The testing device also has an illumination arrangement for illuminating an imaging area of the inner surface which is detected by the optical system. The illumination arrangement is designed and configured for illuminating the inner surface which is detected by the optical system. The illumination arrangement can illuminate the inner surface to be tested from different illumination directions in order to generate shadow images of the topography of the inner surface. The evaluation apparatus is designed and configured for determining the topography based on the shadow images recorded by the image recorder.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile