The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2018
Filed:
Oct. 29, 2012
Koninklijke Philips N.v., Eindhoven, NL;
Jacobus Hermanus Maria Neijzen, Heeze, NL;
Wendy Uyen Dittmer, Eindhoven, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
A first output light beam (L) that originates from a total internal reflection at a detection surface () of a total internal reflection TIR chamber () and a second output light beam (L') that comes from the interior of an inspectable chamber () are both received within an observation region (OR). Preferably, these output light beams are detected with the same light detector, e.g. an image sensor (). A total internal reflection at the TIR chamber and reflected light from inside the inspectable chamber are both directed to the same observation region (OR). This is for example enabled by different inclinations of the windows encountered by the first and the second output light beams, by different optical elements () in the paths of the output light beams, and/or by light scattering surface structures () in the inspectable chamber.