The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2018
Filed:
Jul. 22, 2013
Applicant:
The Regents of the University of California, Oakland, CA (US);
Inventors:
Paul K. Hansma, Goleta, CA (US);
Connor Randall, Santa Barbara, CA (US);
Daniel Bridges, Goleta, CA (US);
Assignee:
The Regents of the University of California, Oakland, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/40 (2006.01); G01N 3/04 (2006.01); G01N 3/42 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 3/40 (2013.01); A61B 5/0053 (2013.01); A61B 5/4504 (2013.01); G01N 3/04 (2013.01); G01N 3/42 (2013.01);
Abstract
The field of the invention generally relates to probes, related devices and methods for measuring material properties. In an embodiment, the present invention provides a test probe for use in a reference point indentation device. The test probe has an end proximal to a tip and an end distal to the tip. The distal end of the test probe has a self-centering mate comprising a countersink of about 90 degrees to about 100 degrees to a depth of between 0.010 in. and 0.035 in.