The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Jan. 14, 2016
Applicant:

Oki Electric Industry Co., Ltd., Tokyo, JP;

Inventor:

Kengo Koizumi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/04 (2006.01); G01J 9/04 (2006.01); G01D 5/353 (2006.01); G01K 11/32 (2006.01); G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
G01K 11/32 (2013.01); G01D 5/35364 (2013.01); G01J 3/4412 (2013.01); G01J 9/04 (2013.01); G01K 2011/322 (2013.01);
Abstract

A measuring apparatus includes a light source unit configured to generate probe light, a bifurcating unit configured to cause Brillouin backscattered light occurring from the probe light to bifurcate into first light, which propagates through a first optical path, and second light, which propagates through a second optical path, a delay unit configured to delay one of the first light and the second light, an optical multiplexer configured to multiplex the first light and the second light to generate multiplexed light, and a coherent detector configured to perform homodyne detection of the multiplexed light and to output a difference frequency obtained as a result of the detection as a phase-difference signal.


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